IEEE 2017 NSS/MIC/RTSD ControlCenter

Online Program Search result for ”keyword:"bias"“ - One match

To search for a specific ID please enter the hash sign followed by the ID number (e.g. #123).

N-23-169 – Silicon PhotoMultiplier (SiPM) Temperature Measurement using Direct Bias (#3693)

A. Abba1, V. Arosio1, M. Caccia2, F. Caponio1, R. Santoro2

Session: N-23 - NSS Poster Session II
Date: Wednesday, October 25, 2017, 10:20 am
Room: Grand Hall West ()