IEEE 2017 NSS/MIC/RTSD ControlCenter

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R-17-4 – Fabrication and evaluation of vertical-type BGaN neutron detection diodes (#1105)

T. Nakano1, K. Mochizuki1, T. Arikawa1, H. Nakagawa2, S. Usami3, Y. Honda4, H. Amano4, 5, K. Kojima6, S. F. Chichibu6, 4, H. Mimura7, Y. Inoue1, T. Aoki7

Session: R-17 - Electronics and Detectors
Date: Friday, October 27, 2017, 8:00 am
Room: Regency VI ()