IEEE 2017 NSS/MIC/RTSD ControlCenter

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N-34-6 – Final system tests of the DEPFET based Belle II pixel detector PXD (#3415)

L. Andricek1, R. H. Richter1

Session: N-34 - Semiconductor Detectors (Tracking and Spectroscopy) II
Date: Thursday, October 26, 2017, 10:20 am
Room: Centennial II ()