IEEE 2017 NSS/MIC/RTSD ControlCenter

Online Program Search result for ”keyword:"beam hardening correction"“ - One match

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M-15-053 – Novel material identification method using three energy bins of a photon counting detector taking into consideration Z-dependent beam hardening effect correction with the aim of producing an X-ray image with information of effective atomic number (#1518)

N. Kimoto1, H. Hayashi2, T. Asahara1, E. Tomita3, S. Goto3, Y. Mihara1, Y. Kanazawa2, T. Yamakawa4, S. Yamamoto4, M. Yamasaki4, M. Okada4, D. Hashimoto5

Session: M-15 - MIC Poster Session III
Date: Friday, October 27, 2017, 1:40 pm
Room: Grand Hall West ()