IEEE 2017 NSS/MIC/RTSD ControlCenter

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J-01-6 – Large Area Si Pixel Sensor Processing on 8" High Resistive Wafers and Applying the Monolithic Pixel Sensor for Inspection of Art (#2053)

J. Kalliopuska1, J. Uher2, K. Lavanti1, J. Jakubek3, J. Salmi1, M. Jakubek3, S. Vähänen1, E. Trojanova3

Session: J-01 - NSS / RTSD Joint
Date: Tuesday, October 24, 2017, 4:00 pm
Room: Centennial II ()