IEEE 2017 NSS/MIC/RTSD ControlCenter

Online Program Search result for ”keyword:"alpha spectroscopy"“ - 4 matches

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R-09-3 – Development of a SiC Schottky Diode for High Temperature Alpha Spectroscopy (#2251)

J. Jarrell1, T. Blue1, L. R. Cao1

Session: R-09 - Semiconductor Materials I
Date: Wednesday, October 25, 2017, 8:00 am
Room: Regency VI ()

R-07-016 – Electronic Properties of CH3NH3PbBr3 (#2734)

T. Smith1, C. Seal1, J. Tisdale1, M. Ahmadi1, D. Hamm1, B. Hu1, E. D. Lukosi1

Session: R-07 - Posters and Exhibition viewing
Date: Tuesday, October 24, 2017, 2:00 pm
Room: Grand Hall West ()

R-11-2 – Fabrication and characterization of n-type 4H-SiC epitaxial Schottky detectors: Deep level transient spectroscopy, Cathodoluminescence, Electron beam induced current, and Pulse height studies (#4146)

C. Oner1, T. A. Chowdhury1, J. W. Kleppinger1, K. C. Mandal1

Session: R-11 - Semiconductor Materials II
Date: Wednesday, October 25, 2017, 1:40 pm
Room: Regency VI ()

R-07-003 – Comparative Studies on Solvent Grown Cd0.9Zn0.1Te Gamma Detectors in Various Single-Polarity Charge Sensing Device Geometries (#4147)

C. Oner1, T. A. Chowdhury1, K. C. Mandal1

Session: R-07 - Posters and Exhibition viewing
Date: Tuesday, October 24, 2017, 2:00 pm
Room: Grand Hall West ()