IEEE 2017 NSS/MIC/RTSD ControlCenter

Online Program Search result for ”keyword:"4h-sic"“ - 2 matches

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R-09-3 – Development of a SiC Schottky Diode for High Temperature Alpha Spectroscopy (#2251)

J. Jarrell1, T. Blue1, L. R. Cao1

Session: R-09 - Semiconductor Materials I
Date: Wednesday, October 25, 2017, 8:00 am
Room: Regency VI ()

R-11-2 – Fabrication and characterization of n-type 4H-SiC epitaxial Schottky detectors: Deep level transient spectroscopy, Cathodoluminescence, Electron beam induced current, and Pulse height studies (#4146)

C. Oner1, T. A. Chowdhury1, J. W. Kleppinger1, K. C. Mandal1

Session: R-11 - Semiconductor Materials II
Date: Wednesday, October 25, 2017, 1:40 pm
Room: Regency VI ()